Ellipsometric measurement of thickness of tin oxides grown by voltammetry in phosphate solution of pH 8.7. Journal of Electrochemical Science and Engineering, [S. l.], v. 6, n. 4, p. 303–314, 2016. DOI: 10.5599/jese.326. Disponível em: https://pub.iapchem.org/ojs/index.php/JESE/article/view/326. Acesso em: 26 apr. 2026.